CyberOptics Semiconductor to Discuss Solutions for Semiconductor Tool Qualification at ISMI Manufacturing Week

Top Quote CyberOptics Semiconductor (www.cyberopticssemi.com) will discuss how a "Wireless Particle Counting Wafer Improves Semiconductor Tool Qualification" during ISMI Manufacturing Week 2011 to be held in Austin, TX during October 17 - 21. End Quote
  • (1888PressRelease) October 07, 2011 - During ISMI Manufacturing Week, Allyn Jackson, CyberOptics Technical Support Manager, will explain how the WaferSense® Airborne Particle Sensor offers faster, more accurate qualification of process tools than traditional particle measurement methods such as monitor wafers and bench-top counters. Real-life scenarios of how advanced wafer processing companies have successfully counted particles down to 100nm in real-time using the Airborne Particle Sensor will be discussed.

    CyberOptics Semiconductor introduced the WaferSense Airborne Particle Sensors (APS) early this year. The only semiconductor sensor of its kind to identify particle sources in tool, the APS moves through semiconductor process equipment and automation material handing systems to monitor airborne particles, reporting information in real-time to allow engineers to efficiently validate wafer contamination. With a wafer-like shape compatible with existing automation and wireless communication providing real-time data, the Airborne Particle Sensor speeds tool qualification and release to production. APS reduces time locating particle sources.

    For more information on the Airborne Particle Sensor, please refer to our web site at http://www.cyberopticssemi.com/products/wafersense/aps/ or contact sales at (503) 495-2200. For more information on the event, refer to ISMI Manufacturing Week at http://www.sematech.org/cgi-bin/ismisym/agenda.cgi#session2_18

    About CyberOptics Semiconductor, Inc.
    CyberOptics Semiconductor develops wireless products that seamlessly measure critical parameters in semiconductor fabrication processes and equipment. The company's pioneering WaferSense® line includes wireless metrology devices for vibration, leveling, gapping, robot teaching and sensing airborne particles in semiconductor process equipment. The company is the largest producer of reflective wafermapping sensors and a leading provider of frame grabber machine vision boards under its HAMA Sensors™ and Imagenation™ brands. CyberOptics Semiconductor is a subsidiary of CyberOptics Corp. (Nasdaq:CYBE), one of the world's leading providers of process yield and throughput improvement solutions for the electronic assembly and semiconductor fabrication industries. For information, visit http://www.cyberopticssemi.com/, e-mail CSsales ( @ ) cyberoptics dot com or call 800-366-9131 dot

    Contacts:
    CyberOptics Semiconductor, Inc.
    Lindsey Dietz
    503.495.2217
    ldietz ( @ ) cyberoptics dot com
    http://www.cyberopticssemi.com /

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