Newest XRF Analyzer Solves Coating Thickness Measurement and Elemental Analysis Needs

Top Quote The new Element Xr x-ray fluorescence analyzer has been developed to provide the best price-to-performance ratio for specific measurement needs. Expanded capabilities (elemental analysis) are also achievable with proper configurations. The Element Xr M6 is available through Eastern Applied Research. End Quote
  • (1888PressRelease) July 10, 2012 - Buffalo, NY - With the Element Xr line of x-ray fluorescence (XRF) analyzers establishing itself as a top value for coating thickness measurement needs, Eastern Applied Research has developed the newest XRF from the line to go beyond just thickness. The Element Xr M6 provides users the ability to accurately measure a range of coating thicknesses but also to obtain qualitative and quantitative analysis of materials.

    Available with three options of detector systems, the EXr M6 can be customized to provide the best price-to-performance ratio for a specific testing need. The traditional version of the system features a proportional counter detection system and is optimum for standard coating thickness measurements (single layer, etc). This configuration provides the lowest cost of acquisition. If a user is considering x-ray fluorescence for more involved thickness needs (thin film, multi-layer) or has a quantitative analysis interest then newer detector technologies, Si-PIN and Silicon Drift (SDD), would be offered. While still offering excellent value based on the overall analyzer design, these detectors provide increased sensitivity, greater resolution and faster measurement times.

    Designed for expanding the Element Xr line beyond coating thickness applications, the overall chamber design was also developed with versatility of application in mind. A top-down measurement system, the chamber has an accommodating door that swings open (up/down) to expose both the front and sides of the interior chamber. Many large parts will easily fit in the chamber that includes a moveable stage platform. A last advancement of the line featured in this latest model is the new software package which provides an overall streamlined navigation and report functionality through its Windows7 OS operation.

    For over twenty years, Eastern Applied Research has provided x-ray fluorescence solutions for coating thickness measurement and material analysis needs. The new Element Xr analyzer line offers versatility and precision for basic to complex coating applications. Information on the full range of XRF analyzers available can be found at

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