IEEE and ASTR to Host Workshop on Accelerated Stress Testing & Reliability
ASTR 2013 will provide a forum to exchange knowledge and share ideas that address industry endeavors to limit field failures of products and to revisit existing qualification procedures.
- San Diego, CA (1888PressRelease) September 10, 2013 - An exciting workshop on Accelerated Stress Testing & Reliability will be hosted October 9 -11 in San Diego and will feature industry leading keynote speakers and selected timely presentations. The focus will be on improving strategies to screen defects and weaknesses in electronic, electro-mechanical, and structural systems while reconciling high product quality and improved reliability with low product development cost and fast time to market. ASTR 2013 will provide an exciting forum to exchange knowledge and share ideas that address practical and effective ways to reduce field failures of products.
At this workshop, you will learn how to produce mature products at market introduction, quickly evaluate product maturity or screen for manufacturing defects using high levels of combined stresses in shorter time. Techniques you learn at this conference will focus on testing electronic and electro-mechanical hardware to destruction limits to learn more about the physics-of-failure. The result to you and your company are cost effective improvements with improved market share.
Keynotes include "Enterprise, Why Now" with Wally Massenburg, Senior Director, Mission Assurance Business Execution at Raytheon Integrated Defense Systems and "Qualification and Reliability Test Methods for New Component Technologies" with Dr. Alain Bensoussan, Senior Engineer on EEE parts at Thales Alenia Space.
ASTR 2013 will take place October 9-11 at the Catamaran in San Diego, California. IEEE/ASQ Members receive a discounted price of $750 and Non-Member registration is $950, both prices are available if registered by Sunday, September 15. To reserve, or for more information, visit http://www.ieee-astr.org/.
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