1888PressRelease.com
1888 PressRelease Home Sign In Register About Us Sitemap
  
02
Nov
2008

McPherson, Inc. releases X ray, EUV Spectrometer

The McPherson 251MX spectrometer enables simultaneous spectral detection over a wide ultraviolet wavelength range, reduces calibration errors, and increases the amount of data collected in a given amount of time.


(1888PressRelease) November 02, 2008 - McPherson, Inc. is pleased to release an x-ray and extreme ultraviolet (EUV) spectrometer, the 251MX, for wavelength dispersive spectral measurements from 0.6 to 20nm (60 to 2000eV.) The 251MX provides corrected, flat field spectra with its selection of specially designed diffraction gratings. Data is acquired quickly and easily with direct-detection charge coupled detectors (CCDs.) The clean stainless steel chamber and vacuum-prepared internal components allow efficient pumping for high vacuum or ultra high vacuum (UHV) applications. The 251MX’s small footprint simplifies integration to experiment systems. The two available gratings, for 0.6 to 6nm and 5 to 20nm have square groove profiles; the laminar design helps to reduce effects of high diffracted orders. The corrected grating designs deliver high resolution spectra.

The McPherson 251MX advances laboratory soft x-ray and EUV spectral characterization. It enables simultaneous spectral detection over a wide range. The dedicated optical geometry reduces chances for calibration errors, and increases the amount of data collected in a given amount of time. The 251MX feature set is ideal for many applications: soft x-ray plasma diagnostics, analysis of high order harmonic generated coherent EUV lasers, characterization of extreme ultraviolet sources for high resolution imaging, fabrication or advanced semiconductor lithography processes.

Your 251MX arrives as a spectrograph or turnkey integrated system, with pumps and detector. It is vacuum leak tested and certified and provided with measured optical performance data in the wavelength region of interest.

McPherson, Inc. (Chelmsford, MA USA) manufactures instruments and systems for spectroscopy that measure and tune specific wavelengths of light. McPherson instruments are available for quality control, teaching, physics and astronomy applications at many wavelengths; soft x-ray, vacuum UV, ultraviolet, visible and infrared (up to and including MWIR and LWIR.) For more information visit www.McPhersonInc.com or call 1-978-256-4512 today.

###
 

Other Related Press Releases

Kussu Productions unveils The Urban Sound of Lagos by Anne Marie Lara

Nextar Debuts Advanced GPS Navigation System with MSN Direct Service Free for 12 Months by Antarra Communications

McPherson, Inc. releases X ray, EUV Spectrometer by Mcpherson, Inc. / Erik Schoeffel

Contact Information

Erik Schoeffel

Mcpherson, Inc. / Erik S choeffel

01824

Voice: 978 256 4512

Visit our Site

Press Release Tools