CAS-MI Gains Powerful Analytical Tool
CAS-MI Laboratories' recent purchase of a SEM/EDS has an almost unlimited amount of applications for paint testing, coatings analysis and failure analysis.
- Ann Arbor, MI (1888PressRelease) June 28, 2011 - CAS-MI Laboratories gains a powerful new tool to help the coatings industry solve problems and develop new products. The recent purchase of a Scanning Electron Microscope/Energy Dispersive X-ray Detector (SEM/EDS) provides high resolution imaging with elemental analysis, as well as particle sizing and particle characterization. CAS-MI's scientists will use the instrument's images and data to help clients solve coatings failures, identify contaminants and characterize materials.
The instrument is a Hitachi TM3000 Table Top Scanning Electron Microscope/Bruker Quantax 70 Energy Dispersive X-ray Detector. It features a magnification range of 15x to 30,000x with variable accelerating voltages 5Kv, 15Kv, and high beam analysis current for EDS X-ray analysis. Its multiple imaging modes of compositional, normal, and topographical provide flexibility of imaging quality. A large chamber with a rotating stage can accommodate specimens up to 70mm in diameter and 50mm in height. The TM3000 also has a Quantax 70 Bruker Energy Dispersive X-ray Detector for elemental microanalysis. The Quantax has a compact silicon drift detector which allows for light element analysis from boron up with a 30mm2 detection area.
"The SEM/EDS has an almost unlimited number of applications," says Michele Bruck, Director of Analytical Services at CAS-MI Laboratories, "This very powerful and versatile analytical tool will allow CAS-MI to do high resolution imaging with elemental analysis of many types of materials, including coatings, inks, and films". CAS-MI's scientists are experts at interpreting the resulting data in such projects as paints and coatings failures, the analysis of substrates and metal pretreatments, coating contamination, or in cases involving materials identification.